Near-field optical microscope using a silicon-nitride probe
نویسندگان
چکیده
Operation of an alternative near-field optical microscope is presented. The microscope uses a microfabricated silicon-nitride probe with integrated cantilever, as originally developed for force microscopy. The cantilever allows routine close contact near-field imaging on arbitrary surfaces without tip destruction. The effect of adhesion forces on the coupling to the evanescent wave has been observed. Images with a lateral resolution of about 50 nm are presented and compared with atomic force images. A specific sample area can be selected using an integrated conventional light microscope.
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